Park NX10 AFM with SICM Module

Atomic Force Microscopy

The NX10 Atomic Force Microscope (AFM) is based on a flexure-based design which decouples XY and Z. With an achievable scan range of 100 μm in XY and 15 μm and 30 μm (with extended Z as we have configured to accommodate cell imaging). Scanner bow artifacts (otherwise known as “out-of-lane motion”) measure less than 1 nm over an 80 μm scan.  The NX10 has closed-loop XYZ position sensors as well as motorized XY sample stage positioning. Particularly important for structural DNA nanotechnology imaging, the NX10 offers SmartScan Auto mode for Automated image optimization. The system also offers integrated probe spring constant calibration, which is important for nanomechanical characterization. The key features of the NX10 AFM are summarized in Table 1 with SICM specifications summarized in Table 2.

Park NX10 AFM with SICM Module

Scanning Ion Conductance Microscopy

The Scanning Ion Conductance Microscopy (SICM) module makes this scanning probe instrument unique and expands the functionality of the NX10 to a wider range of applications including analytical chemistry, cell biology, electrophysiology and neuroscience. SICM is a scanning probe technique invented in 1989 that utilizes an electrolyte-filled nanopipette as a sensitive probe capable of imaging conducting and nonconducting samples in liquid (Hansma et al. Science 1989). This technology powerfully complements traditional AFM, providing the ability to non-destructively visualize and map surface conductivity, ion flow, and steep topographies in solution. The ionic current flow is a function of nanopipette height above a surface, and therefore topography can be mapped during scanning using the feedback system that adjusts the height of nanopipette to maintain constant ionic current. While glass nanopipettes typically have inner diameters on the order of 100 nm, SICM imaging can achieve resolution of 12.5 nm with ultrafine nanopipettes (Shevchuk et al. Angewandte Chemie 2006).

Table 1. NX10 AFM features

The following table lists the features of Park Systems NX10 Atomic Force Microscope.

Park NX10 AFM specifications (courtesy of Park Systems)

Table 2. NX10 SICM features

The following table lists the features of the Park Systems NX10 Scanning Ion Conductance Microscopy module.

Park NX10 SICM specifications (courtesy of Park Systems)

Software

The operating software for Park Systems AFMs is called SmartScan. The typical workflow involves the steps: (1) “Setup,” which guides you through instrument settings and sample placement, (2) “Position,” which automatically performs cantilever frequency sweeps and automated Z-approach as well as auto-focusing, and (3) “Imaging,” which sets imaging parameters and begins the scanning of the sample. This software workflow has been designed for industry applications, streamlining the process and automating the most time-consuming aspects of AFM imaging. In addition to traditional AFM imaging, the software acquisition tools also support SICM imaging.